A low noise single-transistor transimpedance preamplifier for Fourier-transform mass spectrometry using a T feedback network
Lin, Tzu-Yung, Green, Roger J. and O’Connor, Peter B.. (2012) A low noise single-transistor transimpedance preamplifier for Fourier-transform mass spectrometry using a T feedback network. Review of Scientific Instruments, Vol. 83 (No. 9). 094102. ISSN 0034-6748Full text not available from this repository.
Official URL: http://dx.doi.org/10.1063/1.4751851
A novel single-transistor transimpedance preamplifier has been introduced for improving performance in Fourier-transform ion cyclotron resonance (FT-ICR) mass spectrometry. A low noise junction field-effect transistor (JFET), BF862, is used as the main amplification stage of this trans-impedance preamplifier, and a T-shaped feedback network is introduced as both the feedback and the gate biasing solutions. The T feedback network has been studied using an operational amplifier (Op Amp), AD8099. Such a feedback system allows ∼100-fold less feedback resistance at a given transimpedance, hence preserving bandwidth, which is beneficial to applications demanding high gain. The single-transistor preamplifier yields a tested transimpedance of ∼104 Ω (80 dBΩ) in the frequency range between 1 kHz and 1 MHz (mass-to-charge ratio, m/z, of around 180-180k for a 12-T FT-ICR system), with a low power consumption of ∼6 mW, which implies that this preamplifier is well suited to a 12-T FT-ICR mass spectrometer. In trading noise performance for higher trans-impedance, an alternative preamplifier design, an AD8099 preamplifier with the T feedback network, has also been studied with a capability of ∼106 Ω (120 dBΩ) transimpedance in the same frequency range. The resistive components in the T feedback network reported here can be replaced by complex impedances, which allows adaptation of this feedback system to other frequency, transimpedance, and noise characteristics for applications not only in other mass spectrometers, such as Orbitrap, time-of-flight (TOF), and ion trap systems, but also in other charge/current detecting systems such as spectroscopy systems, microscopy systems, optical communication systems, or charge-coupled devices (CCDs).
|Item Type:||Journal Article|
|Divisions:||Faculty of Science > Chemistry
Faculty of Science > Engineering
|Journal or Publication Title:||Review of Scientific Instruments|
|Publisher:||American Institute of Physics|
|Access rights to Published version:||Restricted or Subscription Access|
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