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Depth-dependent critical behavior in V2H
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Del Genio, Charo I., Trenkler, Johann, Bassler, Kevin, Wochner, Peter, Haeffner, Dean, Reiter, George, Bai, Jianming and Moss, Simon (2009) Depth-dependent critical behavior in V2H. Physical Review B (Condensed Matter and Materials Physics), Vol.79 (No.18). Article no. 1 84113 . doi:10.1103/PhysRevB.79.184113 ISSN 1098-0121.
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Official URL: http://dx.doi.org/10.1103/PhysRevB.79.184113
Abstract
Using x-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective “skin layer” of V2H. In the skin layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.
| Item Type: | Journal Article | ||||
|---|---|---|---|---|---|
| Divisions: | Faculty of Science, Engineering and Medicine > Science > Mathematics | ||||
| Journal or Publication Title: | Physical Review B (Condensed Matter and Materials Physics) | ||||
| Publisher: | American Physical Society | ||||
| ISSN: | 1098-0121 | ||||
| Official Date: | 2009 | ||||
| Dates: |
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| Volume: | Vol.79 | ||||
| Number: | No.18 | ||||
| Page Range: | Article no. 1 84113 | ||||
| DOI: | 10.1103/PhysRevB.79.184113 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access |
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