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On the mechanism of recombination at oxide precipitates in silicon
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Murphy, John D., Bothe, K., Voronkov, V. V. and Falster, R. J. (2013) On the mechanism of recombination at oxide precipitates in silicon. Applied Physics Letters, Vol.102 (No.4). Article no. 042105. doi:10.1063/1.4789858 ISSN 0003-6951.
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Official URL: http://dx.doi.org/10.1063/1.4789858
Abstract
Oxide precipitates are well known to degrade minority carrier lifetime in silicon, but the mechanism by which they act as recombination centres is not fully understood. We report minority carrier lifetime measurements on oxide precipitate-containing silicon which has been intentionally contaminated with iron. Analysis of the injection-dependence of lifetime demonstrates the same recombination centres exist in iron-contaminated and not intentionally contaminated samples, with the state density scaling with iron loss from the bulk. This shows that recombination activity arises from impurity atoms segregated to oxide precipitates and/or surrounding crystallographic defects.
Item Type: | Journal Article | ||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Journal or Publication Title: | Applied Physics Letters | ||||
Publisher: | American Institute of Physics | ||||
ISSN: | 0003-6951 | ||||
Official Date: | 13 January 2013 | ||||
Dates: |
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Volume: | Vol.102 | ||||
Number: | No.4 | ||||
Page Range: | Article no. 042105 | ||||
DOI: | 10.1063/1.4789858 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access |
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