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Intermittent contact-scanning electrochemical microscopy (IC-SECM): a new approach for tip positioning and simultaneous imaging of interfacial topography and activity

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McKelvey, Kim, Edwards, Martin A. and Unwin, Patrick R. (2010) Intermittent contact-scanning electrochemical microscopy (IC-SECM): a new approach for tip positioning and simultaneous imaging of interfacial topography and activity. Analytical Chemistry, Vol.82 (No.15). pp. 6334-6337. ISSN 0003-2700

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Official URL: http://dx.doi.org/10.1021/ac101099e

Abstract

A new scanning electrochemical microscopy (SECM) tip positioning method that allows surface topography and activity to be resolved simultaneously and independently is presented. The tip, controlled by a piezoelectric positioner operated in closed loop, is oscillated normal to the substrate surface. Changes in the oscillation amplitude, caused by the intermittent contact (IC) of the tip with the substrate surface, are used as a feedback signal to control the tip height. The method is illustrated with amperometric feedback approach curve measurements to inert (insulating) and active (conducting) substrates using 12.5 and 1 mu m radii Pt disk electrodes. Imaging of gold bands on a glass substrate demonstrates the capabilities for simultaneous topography and activity mapping. The prospect for using IC methodology more widely with other types of tips is highlighted briefly.

Item Type: Journal Item
Subjects: Q Science > QD Chemistry
Divisions: Faculty of Science > Chemistry
Faculty of Science > Molecular Organisation and Assembly in Cells (MOAC)
Journal or Publication Title: Analytical Chemistry
Publisher: American Chemical Society
ISSN: 0003-2700
Date: 1 August 2010
Volume: Vol.82
Number: No.15
Number of Pages: 4
Page Range: pp. 6334-6337
Identification Number: 10.1021/ac101099e
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Title of Event: 13th Conference of the European-Society-for-Electroanalytical-Chemistry
Location of Event: Gijon, SPAIN
Date(s) of Event: JUN, 2010
URI: http://wrap.warwick.ac.uk/id/eprint/5485

Data sourced from Thomson Reuters' Web of Knowledge

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