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Digital electron diffraction – seeing the whole picture

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Beanland, R., Thomas, Paul J., Woodward, David I., Thomas, Pam A. and Römer, Rudolf A. (2013) Digital electron diffraction – seeing the whole picture. Acta Crystallographica Section A Foundations of Crystallography, Volume 69 (Number 4). pp. 427-434. doi:10.1107/S0108767313010143 ISSN 0108-7673.

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Official URL: http://dx.doi.org/10.1107/S0108767313010143

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Abstract

The advantages of convergent-beam electron diffraction for symmetry determination at the scale of a few nm are well known. In practice, the approach is often limited due to the restriction on the angular range of the
electron beam imposed by the small Bragg angle for high-energy electron diffraction, i.e. a large convergence angle of the incident beam results in overlapping information in the diffraction pattern. Techniques have been
generally available since the 1980s which overcome this restriction for individual diffracted beams, by making a compromise between illuminated area and beam
convergence. Here a simple technique is described which overcomes all of these problems using computer control, giving electron diffraction data over a large
angular range for many diffracted beams from the volume given by a focused electron beam (typically a few nm or less). The increase in the amount of information significantly improves the ease of interpretation and widens the applicability of the technique, particularly for thin materials or those with larger lattice parameters

Item Type: Journal Article
Divisions: Faculty of Science, Engineering and Medicine > Science > Physics
Journal or Publication Title: Acta Crystallographica Section A Foundations of Crystallography
Publisher: Wiley-Blackwell Publishing, Inc.
ISSN: 0108-7673
Official Date: 2013
Dates:
DateEvent
2013Published
Volume: Volume 69
Number: Number 4
Page Range: pp. 427-434
DOI: 10.1107/S0108767313010143
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access

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