An industry-based survey of reliability in power electronic converters
Yang, Shaoyong, Bryant, Angus T., Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li and Tavner, Peter (2009) An industry-based survey of reliability in power electronic converters. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, SEP 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 2612-2618.Full text not available from this repository.
A questionnaire survey was carried out to determine the industrial requirements and expectations of reliability in power electronic converters. According to the survey, power semiconductor devices ranked the most fragile components. It was concluded that main stresses were from the environment, transients and heavy loads, which should be considered during power electronic system design and normal operation. Further analyses suggest that power device reliability is a key issue and power electronic converter design is correlated with failure costs.
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||T Technology > TJ Mechanical engineering and machinery
T Technology > TK Electrical engineering. Electronics Nuclear engineering
|Divisions:||Faculty of Science > Engineering|
|Journal or Publication Title:||2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6|
|Official Date:||May 2009|
|Number of Pages:||7|
|Page Range:||pp. 2612-2618|
|Title of Event:||IEEE Energy Conversion Congress and Exposition|
|Location of Event:||San Jose, CA|
|Date(s) of Event:||SEP 20-24, 2009|
Actions (login required)