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An industry-based survey of reliability in power electronic converters

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Yang, Shaoyong, Bryant, Angus T., Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li and Tavner, Peter (2009) An industry-based survey of reliability in power electronic converters. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, 20-24 Sep 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6, Volume 1-6 pp. 2612-2618. ISBN 9781424428922. doi:10.1109/ECCE.2009.5316356

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Abstract

A questionnaire survey was carried out to determine the industrial requirements and expectations of reliability in power electronic converters. According to the survey, power semiconductor devices ranked the most fragile components. It was concluded that main stresses were from the environment, transients and heavy loads, which should be considered during power electronic system design and normal operation. Further analyses suggest that power device reliability is a key issue and power electronic converter design is correlated with failure costs.

Item Type: Conference Item (Paper)
Subjects: T Technology > TJ Mechanical engineering and machinery
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Journal or Publication Title: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6
Publisher: IEEE
ISBN: 9781424428922
Official Date: 2009
Dates:
DateEvent
2009UNSPECIFIED
Volume: Volume 1-6
Number of Pages: 7
Page Range: pp. 2612-2618
DOI: 10.1109/ECCE.2009.5316356
Status: Peer Reviewed
Publication Status: Published
Conference Paper Type: Paper
Title of Event: IEEE Energy Conversion Congress and Exposition
Type of Event: Other
Location of Event: San Jose, CA
Date(s) of Event: 20-24 Sep 2009

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