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An affine symmetric image model and its applications

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Park, Heechan, Martin, Graham R. and Bhalerao, Abhir. (2010) An affine symmetric image model and its applications. IEEE Transactions on Image Processing, Vol.19 (No.7). pp. 1695-1705. ISSN 1057-7149

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Official URL: http://dx.doi.org/10.1109/TIP.2010.2045692

Abstract

Natural images contain considerable redundancy, some of which is successfully captured using recently developed directional wavelets. In this paper, an affine symmetric image model is considered. It provides a flexible scheme to exploit geometric redundancy. A patch of texture from an image is rotated, scaled and sheared to approximate other similar parts in the image, revealing the self-similarity relation. The general scheme is derived as follows. A texture model is required that identifies structural patterns. Then the affine symmetry is exploited between structural textures at a local level, the objective being to find the minimum residual error by estimating the affine transform relating two patches of texture. Having developed a local model, the methodology is extended to the whole image to estimate the global affine relation. This global model is further developed in a multiresolution framework for multiscale analysis, by which the self similarity of the image is exploited across space and scale. The multiresolution model can be applied to a series of practical problems. Experimental evaluation demonstrates the effectiveness of the approach in affine invariant texture segmentation and image approximation.

Item Type: Journal Article
Subjects: Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software
T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Science > Computer Science
Library of Congress Subject Headings (LCSH): Image processing
Journal or Publication Title: IEEE Transactions on Image Processing
Publisher: IEEE
ISSN: 1057-7149
Date: July 2010
Volume: Vol.19
Number: No.7
Number of Pages: 11
Page Range: pp. 1695-1705
Identification Number: 10.1109/TIP.2010.2045692
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
URI: http://wrap.warwick.ac.uk/id/eprint/5688

Data sourced from Thomson Reuters' Web of Knowledge

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