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An affine symmetric image model and its applications
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Park, Heechan, Martin, Graham R. and Bhalerao, Abhir (2010) An affine symmetric image model and its applications. IEEE Transactions on Image Processing, Volume 19 (Number 7). pp. 1695-1705. doi:10.1109/TIP.2010.2045692 ISSN 1057-7149.
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Official URL: http://dx.doi.org/10.1109/TIP.2010.2045692
Abstract
Natural images contain considerable redundancy, some of which is successfully captured using recently developed directional wavelets. In this paper, an affine symmetric image model is considered. It provides a flexible scheme to exploit geometric redundancy. A patch of texture from an image is rotated, scaled and sheared to approximate other similar parts in the image, revealing the self-similarity relation. The general scheme is derived as follows. A texture model is required that identifies structural patterns. Then the affine symmetry is exploited between structural textures at a local level, the objective being to find the minimum residual error by estimating the affine transform relating two patches of texture. Having developed a local model, the methodology is extended to the whole image to estimate the global affine relation. This global model is further developed in a multiresolution framework for multiscale analysis, by which the self similarity of the image is exploited across space and scale. The multiresolution model can be applied to a series of practical problems. Experimental evaluation demonstrates the effectiveness of the approach in affine invariant texture segmentation and image approximation.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software T Technology > TA Engineering (General). Civil engineering (General) |
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Divisions: | Faculty of Science, Engineering and Medicine > Science > Computer Science | ||||
Library of Congress Subject Headings (LCSH): | Image processing, Geometry, Affine | ||||
Journal or Publication Title: | IEEE Transactions on Image Processing | ||||
Publisher: | IEEE | ||||
ISSN: | 1057-7149 | ||||
Official Date: | 2010 | ||||
Dates: |
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Volume: | Volume 19 | ||||
Number: | Number 7 | ||||
Number of Pages: | 11 | ||||
Page Range: | pp. 1695-1705 | ||||
DOI: | 10.1109/TIP.2010.2045692 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Date of first compliant deposit: | 3 December 2015 | ||||
Date of first compliant Open Access: | 3 December 2015 |
Data sourced from Thomson Reuters' Web of Knowledge
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