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Determination of lattice orientation in aluminium alloy grains by low energy gallium ion-channelling
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Silk, Jonathan R., Dashwood, R. J. and Chater, Richard J. (2010) Determination of lattice orientation in aluminium alloy grains by low energy gallium ion-channelling. In: 19th International Conference on Ion Beam Analysis, University of Cambridge, Cambridge, England, September 07-11, 2009. Published in: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol.268 (No.11-12). pp. 2064-2068.
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Official URL: http://dx.doi.org/10.1016/j.nimb.2010.02.056
Abstract
Polished sections of a fine-grained aluminium, silicon carbide metal matrix composite (MMC) alloy were prepared by sputtering using a low energy gallium ion source and column (FIB). The MMC had been processed by high temperature extrusion. Images of the polished surface were recorded using the ion-induced secondary electron emission. The metal matrix grains were distinguished by gallium ion-channelling contrast from the silicon carbide component. The variation of the contrast from the aluminium grains with tilt angle can be recorded and used to determine lattice orientation with the contrast from the silicon carbide (SIC) component as a reference. This method is rapid and suits site-specific investigations where classical methods of sample preparation fail. (C) 2010 Elsevier B.V. All rights reserved.
| Item Type: | Conference Item (Paper) |
|---|---|
| Subjects: | Q Science > QC Physics T Technology > TA Engineering (General). Civil engineering (General) T Technology > TN Mining engineering. Metallurgy T Technology > TP Chemical technology |
| Divisions: | Faculty of Science > WMG (Formerly the Warwick Manufacturing Group) |
| Journal or Publication Title: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
| Publisher: | Elsevier |
| ISSN: | 0168-583X |
| Date: | June 2010 |
| Volume: | Vol.268 |
| Number: | No.11-12 |
| Number of Pages: | 5 |
| Page Range: | pp. 2064-2068 |
| Identification Number: | 10.1016/j.nimb.2010.02.056 |
| Status: | Peer Reviewed |
| Publication Status: | Published |
| Access rights to Published version: | Restricted or Subscription Access |
| Conference Paper Type: | Paper |
| Title of Event: | 19th International Conference on Ion Beam Analysis |
| Type of Event: | Conference |
| Location of Event: | University of Cambridge, Cambridge, England |
| Date(s) of Event: | September 07-11, 2009 |
| URI: | http://wrap.warwick.ac.uk/id/eprint/5715 |
Data sourced from Thomson Reuters' Web of Knowledge
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