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Surface structural information from photoelectron diffraction
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Woodruff, D. P. (2010) Surface structural information from photoelectron diffraction. Journal of Electron Spectroscopy and Related Phenomena, Vol.178 (Sp.Iss.SI). pp. 186-194. doi:10.1016/j.elspec.2009.06.008 ISSN 0368-2048.
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Official URL: http://dx.doi.org/10.1016/j.elspec.2009.06.008
Abstract
The coherent elastic scattering by surrounding atoms of a photoelectron wave field emitted from an atomic core level provides structural information on the environment of the emitter. This basic phenomenon leads to a range of interrelated methods, the information content of which depends on the photoelectron energy and the mode of detection (angle-scan or energy-scan). A short review is presented of these methods and their application to the investigation of atomic and molecular adsorbates and epitaxial films and particles, using both laboratory-based instrumentation and synchrotron radiation. (C) 2009 Elsevier B.V. All rights reserved.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
Library of Congress Subject Headings (LCSH): | X-ray photoelectron spectroscopy, Surfaces (Physics), Diffraction, Surfaces (Technology) -- Analysis | ||||
Journal or Publication Title: | Journal of Electron Spectroscopy and Related Phenomena | ||||
Publisher: | Elsevier Science BV | ||||
ISSN: | 0368-2048 | ||||
Official Date: | May 2010 | ||||
Dates: |
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Volume: | Vol.178 | ||||
Number: | Sp.Iss.SI | ||||
Number of Pages: | 9 | ||||
Page Range: | pp. 186-194 | ||||
DOI: | 10.1016/j.elspec.2009.06.008 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published |
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