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SOI sensing technologies for harsh environment

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Udrea, Florin, Ali, Syed Z., Brezeanu, M., Dumitru, V., Buiu, O., Poenaru, I., Chowdhury, M. F., De Luca, A. and Gardner, J. W. (2012) SOI sensing technologies for harsh environment. In: 35th International Semiconductor Conference, CAS 2012 , Sinaia, Romania, 15-17 Oct 2012. Published in: Proceedings of the International Semiconductor Conference, CAS, Volume 1 pp. 3-10. doi:10.1109/SMICND.2012.6400708

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Official URL: http://dx.doi.org/10.1109/SMICND.2012.6400708

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Abstract

This paper reviews and addresses certain aspects of Silicon-On-Insulator (SOI) technologies for a harsh environment. The paper first describes the need for specialized sensors in applications such as (i) domestic and other small-scale boilers, (ii) CO2 Capture and Sequestration, (iii) oil & gas storage and transportation, and (iv) automotive. We describe in brief the advantages and special features of SOI technology for sensing applications requiring temperatures in excess of the typical bulk silicon junction temperatures of 150oC. Finally we present the concepts, structures and prototypes of simple and smart micro-hotplate and Infra Red (IR) based emitters for NDIR (Non Dispersive IR) gas sensors in harsh environments.

Item Type: Conference Item (Paper)
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Journal or Publication Title: Proceedings of the International Semiconductor Conference, CAS
Publisher: IEEE
Book Title: CAS 2012 (International Semiconductor Conference)
Official Date: 2012
Dates:
DateEvent
2012Published
Volume: Volume 1
Page Range: pp. 3-10
DOI: 10.1109/SMICND.2012.6400708
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Conference Paper Type: Paper
Title of Event: 35th International Semiconductor Conference, CAS 2012
Type of Event: Conference
Location of Event: Sinaia, Romania
Date(s) of Event: 15-17 Oct 2012

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