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Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
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Blum, Adrienne L., Swirhun, James S., Sinton, Ronald A., Yan, Fei, Herasimenka, Stanislau, Roth, Thomas, Lauer, Kevin, Haunschild, Jonas, Lim, Bianca, Bothe, Karsten, Hameiri, Ziv, Seipel, Bjoern, Xiong, Rentian, Dhamrin, Marwan and Murphy, John D. (2014) Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime. IEEE Journal of Photovoltaics, 4 (1). pp. 525-531. doi:10.1109/JPHOTOV.2013.2284375 ISSN 2156-3381.
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Official URL: http://dx.doi.org/10.1109/JPHOTOV.2013.2284375
Abstract
Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter- and intralaboratory repeatability. This paper presents the results of an international interlaboratory study conducted with 24 participants to determine the precision of the SEMI PV13 eddy-current carrier lifetime measurement test method. Overall, the carrier recombination lifetime between-laboratory reproducibility was found to be within ±11% for the quasi-steady-state mode and ±8% for transient mode for wafer samples, and within ±4% for bulk samples.
Item Type: | Journal Article | ||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Journal or Publication Title: | IEEE Journal of Photovoltaics | ||||
Publisher: | IEEE | ||||
ISSN: | 2156-3381 | ||||
Official Date: | January 2014 | ||||
Dates: |
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Volume: | 4 | ||||
Number: | 1 | ||||
Page Range: | pp. 525-531 | ||||
DOI: | 10.1109/JPHOTOV.2013.2284375 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access |
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