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Building fingerprints with information from three color bands for source camera identification
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Hu, Yongjian, Li, Chang-Tsun and Jian, Chao (2010) Building fingerprints with information from three color bands for source camera identification. In: MiFor '10 - 2nd ACM workshop on Multimedia in forensics, security and intelligence, Firenze, Italy, 25-29 Oct 2010. Published in: MiFor '10 Proceedings of the 2nd ACM workshop on Multimedia in forensics, security and intelligence pp. 111-116. ISBN 9781450301572. doi:10.1145/1877972.1878001
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Official URL: http://dx.doi.org/10.1145/1877972.1878001
Abstract
The imaging sensor (e.g., CCD, CMOS) pattern noise is a noise-like spread-spectrum signal that mainly consists of the photo-response non-uniformity (PRNU) noise. Since each camera has a unique PRNU, the PRNU becomes a popular fingerprint for source camera identification. Current fingerprints are built based on one color band. To better reflect the intrinsic characteristics of the camera, this work explores the way to build fingerprints based on three color bands of an image.
Item Type: | Conference Item (Paper) | ||||
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Divisions: | Faculty of Science, Engineering and Medicine > Science > Computer Science | ||||
Journal or Publication Title: | MiFor '10 Proceedings of the 2nd ACM workshop on Multimedia in forensics, security and intelligence | ||||
Publisher: | ACM, New York | ||||
ISBN: | 9781450301572 | ||||
Book Title: | Proceedings of the 2nd ACM workshop on Multimedia in forensics, security and intelligence - MiFor '10 | ||||
Official Date: | 29 October 2010 | ||||
Dates: |
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Page Range: | pp. 111-116 | ||||
DOI: | 10.1145/1877972.1878001 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Conference Paper Type: | Paper | ||||
Title of Event: | MiFor '10 - 2nd ACM workshop on Multimedia in forensics, security and intelligence | ||||
Type of Event: | Workshop | ||||
Location of Event: | Firenze, Italy | ||||
Date(s) of Event: | 25-29 Oct 2010 |
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