Yin, Xiaokang, Hutchins, David A., Chen, Guoming and Li, Wei (2013) Investigations into the measurement sensitivity distribution of coplanar capacitive imaging probes. NDT & E International, Volume 58 . pp. 1-9. doi:10.1016/j.ndteint.2013.04.001

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Abstract

In this paper, the measurement sensitivity distributions of coplanar capacitive imaging probes are studied. An equation to calculate measurement sensitivity distribution of a coplanar capacitive sensor was derived. The measurement sensitivity distribution of a coplanar capacitive imaging (Cl) probe with two back-to-back triangular electrodes was obtained both from finite element (FE) models and experiment. The effects of specimen under test on the measurement sensitivity distribution were discussed. The measurement sensitivity distribution is useful to evaluate the imaging ability of coplanar capacitive probes with different design parameters and to retrieve the actual shape of the targeted feature. The concept of negative sensitivity has also been introduced, and experiments were also performed so as to verify the existence of negative sensitivity.

Item Type:	Journal Article
Divisions:	Faculty of Science, Engineering and Medicine > Engineering > Engineering
Journal or Publication Title:	NDT & E International
Publisher:	Elsevier Sci Ltd.
ISSN:	0963-8695
Official Date:	September 2013
Dates:	Date Event 12 December 2012 Submitted 5 April 2013 Accepted 15 April 2013 Available September 2013 Published
Volume:	Volume 58
Page Range:	pp. 1-9
DOI:	10.1016/j.ndteint.2013.04.001
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access

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