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Microstructure of highly strained BiFeO3 thin films : transmission electron microscopy and electron-energy loss spectroscopy studies

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Heon Kim, Young, Bhatnagar, Akash, Pippel, Eckhard, Alexe, M. (Marin) and Hesse, Dietrich (2014) Microstructure of highly strained BiFeO3 thin films : transmission electron microscopy and electron-energy loss spectroscopy studies. Journal of Applied Physics, Volume 115 (Number 4). Article number 043526. doi:10.1063/1.4863778

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Official URL: http://dx.doi.org/10.1063/1.4863778

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Abstract

Microstructure and electronic structure of highly strained bismuth ferrite (BiFeO3) thin films grown on lanthanum aluminate substrates are studied using high-resolution transmission and scanning transmission electron microscopies and electron energy loss spectroscopy (EELS). Monoclinic and tetragonal phases were observed in films grown at different temperatures, and a mix of both phases was detected in a film grown at intermediate temperature. In this film, a smooth transition of the microstructure was found between the monoclinic and the tetragonal phases. A considerable increase in the c-axis parameters was observed in both phases compared with the rhombohedral bulk phase. The off-center displacement of iron (Fe) ions was increased in the monoclinic phase as compared with the tetragonal phase. EEL spectra show different electronic structures in the monoclinic and the tetragonal phases. These experimental observations are well consistent with the results of theoretical first-principle calculations performed.

Item Type: Journal Article
Divisions: Faculty of Science > Physics
Journal or Publication Title: Journal of Applied Physics
Publisher: American Institute of Physics
ISSN: 0021-8979
Official Date: 30 January 2014
Dates:
DateEvent
30 January 2014Published
17 January 2014Accepted
28 October 2013Submitted
Volume: Volume 115
Number: Number 4
Article Number: Article number 043526
DOI: 10.1063/1.4863778
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access

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