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Microstructure of highly strained BiFeO3 thin films : transmission electron microscopy and electron-energy loss spectroscopy studies
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Heon Kim, Young, Bhatnagar, Akash, Pippel, Eckhard, Alexe, M. (Marin) and Hesse, Dietrich (2014) Microstructure of highly strained BiFeO3 thin films : transmission electron microscopy and electron-energy loss spectroscopy studies. Journal of Applied Physics, Volume 115 (Number 4). Article number 043526. doi:10.1063/1.4863778 ISSN 0021-8979.
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Official URL: http://dx.doi.org/10.1063/1.4863778
Abstract
Microstructure and electronic structure of highly strained bismuth ferrite (BiFeO3) thin films grown on lanthanum aluminate substrates are studied using high-resolution transmission and scanning transmission electron microscopies and electron energy loss spectroscopy (EELS). Monoclinic and tetragonal phases were observed in films grown at different temperatures, and a mix of both phases was detected in a film grown at intermediate temperature. In this film, a smooth transition of the microstructure was found between the monoclinic and the tetragonal phases. A considerable increase in the c-axis parameters was observed in both phases compared with the rhombohedral bulk phase. The off-center displacement of iron (Fe) ions was increased in the monoclinic phase as compared with the tetragonal phase. EEL spectra show different electronic structures in the monoclinic and the tetragonal phases. These experimental observations are well consistent with the results of theoretical first-principle calculations performed.
Item Type: | Journal Article | ||||||||
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Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||||||
Journal or Publication Title: | Journal of Applied Physics | ||||||||
Publisher: | American Institute of Physics | ||||||||
ISSN: | 0021-8979 | ||||||||
Official Date: | 30 January 2014 | ||||||||
Dates: |
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Volume: | Volume 115 | ||||||||
Number: | Number 4 | ||||||||
Article Number: | Article number 043526 | ||||||||
DOI: | 10.1063/1.4863778 | ||||||||
Status: | Peer Reviewed | ||||||||
Publication Status: | Published | ||||||||
Access rights to Published version: | Restricted or Subscription Access |
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