Yin, Xiaokang, Chen, Guoming, Li, Wei and Hutchins, David A. (2014) Negative measurement sensitivity values of planar capacitive imaging probes. In: QNDE Conference, Baltimore, Maryland, USA, 21–26 Jul 2013, Volume 1581 pp. 1500-1504. ISBN 978735412118. ISSN 0094-243X. doi:10.1063/1.4865000

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Abstract

The measurement sensitivity distribution of planar capacitive imaging (CI) probes describes how effectively each region in the sensing area is contributing to the measured charge signal on the sensing electrode. It can be used to determine the imaging ability of a CI probe. It is found in previous work that, there are regions in the sensing area where the change of the charge output and the change of targeting physical parameter are of opposite trends. This opposite correlation implies that the measurement sensitivity values in such regions are negative. In this work, the cause of negative sensitivity is discussed. Experiments are also designed and performed so as to verify the existence of negative sensitivity and study the factors that may affect the negative sensitivity distributions.

Item Type:	Conference Item (Paper)
Divisions:	Faculty of Science, Engineering and Medicine > Engineering > Engineering
ISBN:	978735412118
ISSN:	0094-243X
Official Date:	18 February 2014
Dates:	Date Event 18 February 2014 Published
Volume:	Volume 1581
Page Range:	pp. 1500-1504
DOI:	10.1063/1.4865000
Status:	Peer Reviewed
Publication Status:	Published
Conference Paper Type:	Paper
Title of Event:	QNDE Conference
Type of Event:	Conference
Location of Event:	Baltimore, Maryland, USA
Date(s) of Event:	21–26 Jul 2013
Related URLs:	Organisation

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