Bulk transport measurements in ZnO: the effect of surface electron layers
Allen, M. W., Swartz, C. H., Myers, T. H., Veal, T. D. (Tim D.), McConville, C. F. (Chris F.) and Durbin, S. M.. (2010) Bulk transport measurements in ZnO: the effect of surface electron layers. Physical Review B (Condensed Matter and Materials Physics), Vol.81 (No.7). Article: 075211. ISSN 1098-0121Full text not available from this repository.
Official URL: http://dx.doi.org/10.1103/PhysRevB.81.075211
Magnetotransport measurements and x-ray photoemission spectroscopy were used to investigate the surface conductivity of ZnO. Near-surface downward band bending, consistent with electron accumulation, was found on the polar and nonpolar faces of bulk ZnO single crystals. A significant polarity effect was observed in that the downward band bending was consistently stronger on the Zn-polar face and weaker on the O-polar face. The surface electron accumulation layer was found to significantly influence the electrical properties of high resistivity, hydrothermally grown bulk ZnO crystals at temperatures below 200 K, and is largely responsible for the anomalously low electron mobility reported for this material.
|Item Type:||Journal Article|
|Subjects:||Q Science > QC Physics|
|Divisions:||Faculty of Science > Physics|
|Journal or Publication Title:||Physical Review B (Condensed Matter and Materials Physics)|
|Publisher:||American Physical Society|
|Number of Pages:||6|
|Page Range:||Article: 075211|
|Access rights to Published version:||Restricted or Subscription Access|
|Funder:||Office of Naval Research, WVNano Initiative, NSF Cooperative Agreement, State of Florida, DOE, Engineering and Physical Sciences Research Council (EPSRC)|
|Grant number:||N00014-02-1-0974, DMR-0084173, EP/G004447/1 (EPSRC)|
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