Evans, Keith and Beanland, R. (2014) High dynamic range electron imaging : the new standard. Microscopy and Microanalysis, Volume 20 (Number 5). pp. 1601-1604. doi:10.1017/S1431927614012975 ISSN 1431-9276.

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Abstract

Transmission electron microscopes regularly produce data which has a dynamic range that exceeds the capabilities of the recording media used, particularly in diffraction patterns. Hardware solutions such as readable phosphor imaging plates have existed since the 1990s, but in recent years the advent of robust CCD digital cameras capable of capturing high intensities in a transmission electron microscope has made image acquisition fast and straightforward. However, all CCD cameras have a saturation limit, making imaging of low intensities difficult when an image is dominated by strong features. Here we present a simple and effective tool to overcome this limitation through acquisition of multiple images and software processing to produce high dynamic range electron images.

Item Type:	Journal Article
Divisions:	Faculty of Science, Engineering and Medicine > Science > Physics
Journal or Publication Title:	Microscopy and Microanalysis
Publisher:	Cambridge University Press
ISSN:	1431-9276
Official Date:	October 2014
Dates:	Date Event October 2014 Published 17 July 2014 Accepted 8 November 2013 Submitted
Volume:	Volume 20
Number:	Number 5
Page Range:	pp. 1601-1604
DOI:	10.1017/S1431927614012975
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access

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