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A model assisted testing scheme for modular multilevel converter
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Tang, Yuan, Ran, Li, Alatise, Olayiwola M. and Mawby, P. A. (Philip A.) (2016) A model assisted testing scheme for modular multilevel converter. IEEE Transactions on Power Electronics, 31 (1). pp. 165-176. doi:10.1109/TPEL.2015.2411694
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Official URL: http://dx.doi.org/10.1109/TPEL.2015.2411694
Abstract
Systems based on the modular multilevel converter (MMC) concept can be used for a variety of applications including HVDC transmission and FACTS devices for power system control. In these applications, both the manufacturer and operator are keen to understand the stress conditions that the submodules are subject to. It is important to test for reliability of the submodules as a function of the design and control variables. This paper proposes a model assisted submodule testing scheme for an MMC that can be used in any of the possible applications. The submodules can be thoroughly tested individually before the complete MMC is built. Experimental measurements have shown the validity and accuracy of the proposed method with close attention given to the synchronization between the signals. The current (with dc bias and harmonic components) passing through the submodule, the switching sequence and the capacitor voltage are shown to be identical to what the submodule would be subjected to when installed in a complete MMC. This test method is capable of facilitating research and development exercises through examining the electromagnetic and electro-thermal characteristics.
| Item Type: | Journal Article | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | ||||||||
| Divisions: | Faculty of Science > Engineering | ||||||||
| Library of Congress Subject Headings (LCSH): | Capacitors , Converters, Electric, Hysteresis, Insulated gate bipolar transistors , Electric switchgear | ||||||||
| Journal or Publication Title: | IEEE Transactions on Power Electronics | ||||||||
| Publisher: | IEEE | ||||||||
| ISSN: | 0885-8993 | ||||||||
| Official Date: | January 2016 | ||||||||
| Dates: |
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| Volume: | 31 | ||||||||
| Number: | 1 | ||||||||
| Page Range: | pp. 165-176 | ||||||||
| DOI: | 10.1109/TPEL.2015.2411694 | ||||||||
| Status: | Peer Reviewed | ||||||||
| Publication Status: | Published | ||||||||
| Access rights to Published version: | Restricted or Subscription Access |
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