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Robustness testing against low voltage transients - a novel approach
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Dhadyalla, Gunwant, McMurran, Ross, Amor-Segan, Mark, Li, Wenjun, Talbot, Kevin and Jones, Richard (2010) Robustness testing against low voltage transients - a novel approach. In: SAE 2010 World Congress & Exhibition, Detroit, MI, U.S.A., Apr 12-15, 2010, 1 doi:10.4271/2010-01-0195 ISSN 0148-7191.
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Official URL: http://dx.doi.org/10.4271/2010-01-0195
Abstract
The increasing use of distributed functions in vehicles can introduce unexpected and undesirable emergent behavior. This can be as a result of transient events such as sudden drops in the supply voltage. In this situation system behavior is often not adequately specified or controlled. This paper presents a novel approach to automotive electronic systems testing addressing robustness against low voltage transient conditions. The paper will discuss the technical output as well as performance in real-world test usage. The proposed approach uses a combination of pseudo-random number generator algorithms to generate parameterized supply voltage waveforms simulating low voltage transient conditions, used to drive the system-under-test (SUT). Two measures are used to judge whether the SUT has passed or failed the test; the detection of unintended recorded Diagnostic Trouble Codes (DTCs) from the error memory of each Electronic Control Unit (ECU) and the detection of unexpected system functionality by a human observer or automated vision system.
| Item Type: | Conference Item (Paper) | ||||
|---|---|---|---|---|---|
| Divisions: | Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group) | ||||
| ISSN: | 0148-7191 | ||||
| Book Title: | SAE Technical Paper Series | ||||
| Official Date: | 2010 | ||||
| Dates: |
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| Volume: | 1 | ||||
| DOI: | 10.4271/2010-01-0195 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Paper | ||||
| Title of Event: | SAE 2010 World Congress & Exhibition | ||||
| Type of Event: | Conference | ||||
| Location of Event: | Detroit, MI, U.S.A. | ||||
| Date(s) of Event: | Apr 12-15, 2010 |
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