Peters, Jonathan J. P., Beanland, R., Alexe, M. (Marin), Cockburn, John W., Revin, Dmitry G., Zhang, Shiyong Y. and Sánchez, Ana M. (2015) Artefacts in geometric phase analysis of compound materials. Ultramicroscopy, 157 . pp. 91-97. doi:10.1016/j.ultramic.2015.05.020 ISSN 0304-3991.

Research output not available from this repository.

Request-a-Copy directly from author or use local Library Get it For Me service.

Request Changes to record.

Abstract

The geometric phase analysis (GPA) algorithm is known as a robust and straightforward technique that can be used to measure lattice strains in high resolution transmission electron microscope (TEM) images. It is also attractive for analysis of aberration-corrected scanning TEM (ac-STEM) images that resolve every atom column, since it uses Fourier transforms and does not require real-space peak detection and assignment to appropriate sublattices. Here it is demonstrated that, in ac-STEM images of compound materials with compositionally distinct atom columns, an additional geometric phase is present in the Fourier transform. If the structure changes from one area to another in the image (e.g. across an interface), the change in this additional phase will appear as a strain in conventional GPA, even if there is no lattice strain. Strategies to avoid this pitfall are outlined.

Item Type:	Journal Article
Divisions:	Faculty of Science, Engineering and Medicine > Science > Physics
Journal or Publication Title:	Ultramicroscopy
Publisher:	Elsevier BV
ISSN:	0304-3991
Official Date:	October 2015
Dates:	Date Event October 2015 Published 28 May 2015 Available 23 May 2015 Accepted 24 March 2015 Submitted
Volume:	157
Page Range:	pp. 91-97
DOI:	10.1016/j.ultramic.2015.05.020
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access

Request changes or add full text files to a record

Repository staff actions (login required)

View Item