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Local discriminant wavelet packet basis for texture classification
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Rajpoot, Nasir M. (Nasir Mahmood) (2003) Local discriminant wavelet packet basis for texture classification. In: Wavelets - Applications in Signal and Image Processing X Conference, San Diego, CA, 04-08 Aug 2003. Published in: Wavelets: Applications in Signal and Image Processing X. SPIE Proceedings, Volume 5207 (Part 1 & 2). pp. 774-783. ISBN 0819450804. ISSN 0277-786X.
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Official URL: http://dx.doi.org/10.1117/12.507681
Abstract
Wavelet packets are well-known for their ability to compactly represent textures consiting of oscillatory patterns such as fingerprints or striped cloth. In this paper, we report recent work on representing both periodic and granular types of texture using adaptive wavelet basis functions. The discrimination power of a wavelet packet subband can be defined as its ability to differentiate between any two texture classes in the transform domain, consequently leading to better classification results. The problem of adaptive wavelet basis selection for texture analysis can, therefore, be solved by using a dynamic programming approach to find the best basis from a library of orthonormal basis functions with respect to a discriminant measure. We present a basis selection algorithm which extends the concept of 'Local Discrminant Basis' (Saito and Coifman, 1994) to two dimensions. The problem of feature selection is addressed by sorting the features according to their relevance as described by the discriminant measure, which has a significant advantage over other feature selection methods that both basis selection and reduction of dimensionality of the feature space can be done simultaneously. We show that wavelet packets are good at representing not only oscillatory patterns but also granular textures. Comparative results are presented for four different distance metrics: Kullback-Leibler (KL) divergence, Jensen-Shannon (JS) divergence, Euclidean distance, and Hellinger distance. Initial experimental results show that Hellinger and Euclidean distance metrics may perform better as compared to other cost functions.
Item Type: | Conference Item (Paper) | ||||
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Subjects: | Q Science > QC Physics | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Computer Science | ||||
Series Name: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | ||||
Journal or Publication Title: | Wavelets: Applications in Signal and Image Processing X. SPIE Proceedings | ||||
Publisher: | SPIE -int society optical engineering | ||||
ISBN: | 0819450804 | ||||
ISSN: | 0277-786X | ||||
Editor: | Unser, MA and Aldroubi, A and Laine, AF | ||||
Official Date: | 13 November 2003 | ||||
Dates: |
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Volume: | Volume 5207 | ||||
Number: | Part 1 & 2 | ||||
Number of Pages: | 10 | ||||
Page Range: | pp. 774-783 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Date of first compliant deposit: | 4 December 2015 | ||||
Date of first compliant Open Access: | 4 December 2015 | ||||
Conference Paper Type: | Paper | ||||
Title of Event: | Wavelets - Applications in Signal and Image Processing X Conference | ||||
Type of Event: | Conference | ||||
Location of Event: | San Diego, CA | ||||
Date(s) of Event: | 04-08 Aug 2003 |
Data sourced from Thomson Reuters' Web of Knowledge
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