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Surface integrity mapping by a novel multi-function tribological probe microscope
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UNSPECIFIED (2004) Surface integrity mapping by a novel multi-function tribological probe microscope. In: 11th World Congress in Mechanism and Machine Science, Tianjin, PEOPLES R CHINA, APR 01-04, 2004. Published in: ELEVENTH WORLD CONGRESS IN MECHANISM AND MACHINE SCIENCE, VOLS 1-5, PROCEEDINGS pp. 2357-2361. ISBN 7-111-14073-7.
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Abstract
This paper presents a new way to measure surface integrity of engineering components. Four surface functions of topography, friction, nano-hardness and Young's modulus can be mapped in a single scan measurement using a recently developed novel instrument, the multi-function Tribological Probe Microscope (TPM). The measurement is based on point-by-point scanning and thus the measured functions are correlated in space and in time. This enables us to determine whether a surface treatment is effective in influencing its mechanical or tribological properties or how local surface features affect these properties.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | T Technology > TL Motor vehicles. Aeronautics. Astronautics T Technology > TJ Mechanical engineering and machinery |
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Journal or Publication Title: | ELEVENTH WORLD CONGRESS IN MECHANISM AND MACHINE SCIENCE, VOLS 1-5, PROCEEDINGS | ||||
Publisher: | CHINA MACHINE PRESS | ||||
ISBN: | 7-111-14073-7 | ||||
Editor: | Huang, T | ||||
Official Date: | 2004 | ||||
Dates: |
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Number of Pages: | 5 | ||||
Page Range: | pp. 2357-2361 | ||||
Publication Status: | Published | ||||
Title of Event: | 11th World Congress in Mechanism and Machine Science | ||||
Location of Event: | Tianjin, PEOPLES R CHINA | ||||
Date(s) of Event: | APR 01-04, 2004 |
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