UNSPECIFIED (2004) Surface integrity mapping by a novel multi-function tribological probe microscope. In: 11th World Congress in Mechanism and Machine Science, Tianjin, PEOPLES R CHINA, APR 01-04, 2004. Published in: ELEVENTH WORLD CONGRESS IN MECHANISM AND MACHINE SCIENCE, VOLS 1-5, PROCEEDINGS pp. 2357-2361. ISBN 7-111-14073-7.

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Abstract

This paper presents a new way to measure surface integrity of engineering components. Four surface functions of topography, friction, nano-hardness and Young's modulus can be mapped in a single scan measurement using a recently developed novel instrument, the multi-function Tribological Probe Microscope (TPM). The measurement is based on point-by-point scanning and thus the measured functions are correlated in space and in time. This enables us to determine whether a surface treatment is effective in influencing its mechanical or tribological properties or how local surface features affect these properties.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	T Technology > TL Motor vehicles. Aeronautics. Astronautics T Technology > TJ Mechanical engineering and machinery
Journal or Publication Title:	ELEVENTH WORLD CONGRESS IN MECHANISM AND MACHINE SCIENCE, VOLS 1-5, PROCEEDINGS
Publisher:	CHINA MACHINE PRESS
ISBN:	7-111-14073-7
Editor:	Huang, T
Official Date:	2004
Dates:	Date Event 2004 UNSPECIFIED
Number of Pages:	5
Page Range:	pp. 2357-2361
Publication Status:	Published
Title of Event:	11th World Congress in Mechanism and Machine Science
Location of Event:	Tianjin, PEOPLES R CHINA
Date(s) of Event:	APR 01-04, 2004

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