Surface integrity mapping by a novel multi-function tribological probe microscope
UNSPECIFIED (2004) Surface integrity mapping by a novel multi-function tribological probe microscope. In: 11th World Congress in Mechanism and Machine Science, Tianjin, PEOPLES R CHINA, APR 01-04, 2004. Published in: ELEVENTH WORLD CONGRESS IN MECHANISM AND MACHINE SCIENCE, VOLS 1-5, PROCEEDINGS pp. 2357-2361.Full text not available from this repository.
This paper presents a new way to measure surface integrity of engineering components. Four surface functions of topography, friction, nano-hardness and Young's modulus can be mapped in a single scan measurement using a recently developed novel instrument, the multi-function Tribological Probe Microscope (TPM). The measurement is based on point-by-point scanning and thus the measured functions are correlated in space and in time. This enables us to determine whether a surface treatment is effective in influencing its mechanical or tribological properties or how local surface features affect these properties.
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||T Technology > TL Motor vehicles. Aeronautics. Astronautics
T Technology > TJ Mechanical engineering and machinery
|Journal or Publication Title:||ELEVENTH WORLD CONGRESS IN MECHANISM AND MACHINE SCIENCE, VOLS 1-5, PROCEEDINGS|
|Publisher:||CHINA MACHINE PRESS|
|Number of Pages:||5|
|Page Range:||pp. 2357-2361|
|Title of Event:||11th World Congress in Mechanism and Machine Science|
|Location of Event:||Tianjin, PEOPLES R CHINA|
|Date(s) of Event:||APR 01-04, 2004|
Actions (login required)