The repeatability of contact-gauge probes against engineering surfaces
Riemer, O (1999) The repeatability of contact-gauge probes against engineering surfaces. In: 1st International Conference and General Meeting of the European-Society-for-Precision-Engineering and Nanotechnology, Bremen, GERMANY, MAY 31-JUN 04, 1999. Published in: PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2 pp. 403-406.Full text not available from this repository.
Growing demands for micormetre-level capability in factory-floor metrology lead to the need for greater understanding of the contact behaviour of probe tips onto engineering surfaces. We report here on the first stage of such work. A simple testrig suitable for determining the parameters for later detailed study is described. A lever geometry is convenient but has inherent errors that are discussed. First results show that even on ground steel workpieces uncertainty in probe indentation is, at this level, a non-negligible factor in the error budget of displacement gauges.
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||T Technology > TS Manufactures
T Technology > TA Engineering (General). Civil engineering (General)
|Journal or Publication Title:||PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2|
|Publisher:||SHAKER VERLAG GMBH|
|Editor:||McKeown, P and Corbett, J and Bonis, M and Sartori, S and Kunzmann, H and Weck, M and Brinksmeier, E and Preub, W|
|Number of Pages:||4|
|Page Range:||pp. 403-406|
|Title of Event:||1st International Conference and General Meeting of the European-Society-for-Precision-Engineering and Nanotechnology|
|Location of Event:||Bremen, GERMANY|
|Date(s) of Event:||MAY 31-JUN 04, 1999|
Actions (login required)