Riemer, O (1999) The repeatability of contact-gauge probes against engineering surfaces. In: 1st International Conference and General Meeting of the European-Society-for-Precision-Engineering and Nanotechnology, Bremen, GERMANY, MAY 31-JUN 04, 1999. Published in: PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2 pp. 403-406.

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Abstract

Growing demands for micormetre-level capability in factory-floor metrology lead to the need for greater understanding of the contact behaviour of probe tips onto engineering surfaces. We report here on the first stage of such work. A simple testrig suitable for determining the parameters for later detailed study is described. A lever geometry is convenient but has inherent errors that are discussed. First results show that even on ground steel workpieces uncertainty in probe indentation is, at this level, a non-negligible factor in the error budget of displacement gauges.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	T Technology > TS Manufactures T Technology > TA Engineering (General). Civil engineering (General)
Journal or Publication Title:	PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2
Publisher:	SHAKER VERLAG GMBH
ISBN:	*************
Editor:	McKeown, P and Corbett, J and Bonis, M and Sartori, S and Kunzmann, H and Weck, M and Brinksmeier, E and Preub, W
Date:	1999
Number of Pages:	4
Page Range:	pp. 403-406
Publication Status:	Published
Title of Event:	1st International Conference and General Meeting of the European-Society-for-Precision-Engineering and Nanotechnology
Location of Event:	Bremen, GERMANY
Date(s) of Event:	MAY 31-JUN 04, 1999
URI:	http://wrap.warwick.ac.uk/id/eprint/7697

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