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Modeling of temperature dependent parasitic gate turn-on in silicon IGBTs
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Bonyadi, Roozbeh, Alatise, Olayiwola M., Jahdi, Saeed, Ortiz Gonzalez, Jose Angel, Ran, Li and Mawby, P. A. (Philip A.) (2015) Modeling of temperature dependent parasitic gate turn-on in silicon IGBTs. In: Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, Seoul, South Korea, 1-5 Jun 2015. Published in: 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) pp. 560-566. doi:10.1109/ICPE.2015.7167839
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Official URL: http://dx.doi.org/10.1109/ICPE.2015.7167839
Abstract
Parasitic turn-on can cause unintentional triggering of the IGBTs since the discharge current of the Miller capacitance coupled with high dV/dt can activate a device that should be off. The short circuit current resulting from parasitic turn-on coupled with the high voltage causes significant power dissipation which can be a reliability issue. This issue is exacerbated by higher ambient temperatures since the negative temperature coefficient of the IGBT's threshold voltage as well as the positive temperature coefficient of the minority carrier lifetime will increase the peak and duration of the short circuit current. Accurate modeling of the shoot-through power and its temperature dependency is important for circuit designers when designing mitigation techniques like multiple resistive paths and bipolar gate drivers. The physics-based model proposed in this paper can produce accurate results with good matching over temperature. The model improves on compact circuit models based on lumped parameters.
| Item Type: | Conference Item (Paper) | ||||
|---|---|---|---|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | ||||
| Divisions: | Faculty of Science > Engineering | ||||
| Journal or Publication Title: | 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) | ||||
| Publisher: | IEEE | ||||
| Official Date: | 2015 | ||||
| Dates: |
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| Page Range: | pp. 560-566 | ||||
| DOI: | 10.1109/ICPE.2015.7167839 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Paper | ||||
| Title of Event: | Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on | ||||
| Type of Event: | Conference | ||||
| Location of Event: | Seoul, South Korea | ||||
| Date(s) of Event: | 1-5 Jun 2015 |
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