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Investigation of parasitic turn-ON in silicon IGBT and Silicon Carbide MOSFET devices : a technology evaluation
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Jahdi, Saeed, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Gammon, P. M., Ran, Li and Mawby, P. A. (Philip A.) (2015) Investigation of parasitic turn-ON in silicon IGBT and Silicon Carbide MOSFET devices : a technology evaluation. In: Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on, Geneva, Switzerland, 8-10 Sep 2015. Published in: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) ISBN 9789075815221. doi:10.1109/EPE.2015.7309093
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Official URL: http://dx.doi.org/10.1109/EPE.2015.7309093
Abstract
This paper investigates the switching rate and temperature dependence of parasitic (false) turn-on of power transistors when switched in power converters implemented in silicon IGBTs and Silicon Carbide (SiC) MOSFETs. It is shown that although high switching rates are normally desirable for minimizing the switching losses, this can result in shoot-through arm currents due to the combination of a Miller capacitance and high dV/dt. The power losses arising from this can be significantly larger than the normal switching losses since the device will still be blocking a considerable voltage. Even though SiC MOSFETs have a significantly smaller Miller capacitance compared with silicon IGBTs, this problem is no less of an issue due to higher switching speeds and lower threshold voltages. Additionally it is seen that the overshoot current increases with temperatures due to the negative temperature coefficient of the threshold voltage in both device technologies. Various solutions to overcome this have been analyzed for both device technologies. It is seen that the effectiveness of the mitigation techniques differs, and in general due to the lower threshold voltage of the SiC device, the solutions proposed are less effective.
Item Type: | Conference Item (Lecture) | ||||
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Journal or Publication Title: | 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) | ||||
Publisher: | IEEE | ||||
ISBN: | 9789075815221 | ||||
Official Date: | 29 October 2015 | ||||
Dates: |
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DOI: | 10.1109/EPE.2015.7309093 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Reuse Statement (publisher, data, author rights): | © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Date of first compliant deposit: | 14 January 2022 | ||||
Date of first compliant Open Access: | 14 January 2022 | ||||
Conference Paper Type: | Lecture | ||||
Title of Event: | Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on | ||||
Type of Event: | Conference | ||||
Location of Event: | Geneva, Switzerland | ||||
Date(s) of Event: | 8-10 Sep 2015 |
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