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Analysis of power device failure under avalanche mode conduction
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Alexakis, Petros, Alatise, Olayiwola M., Hu, Ji, Jahdi, Saeed, Ortiz Gonzalez, Jose Angel, Ran, Li and Mawby, P. A. (Philip A.) (2015) Analysis of power device failure under avalanche mode conduction. In: Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, Seoul, South Korea, 1-5 Jun 2015. Published in: 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) pp. 1833-1839. doi:10.1109/ICPE.2015.7168028
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Official URL: http://dx.doi.org/10.1109/ICPE.2015.7168028
Abstract
This paper investigates the physics of device failure during avalanche for 1.2 kV SiC MOSFETs, silicon MOSFETs and silicon IGBTs. The impact of ambient temperature, initial conditions of the device prior to avalanche breakdown and the avalanche duration is explored for the different technologies. Two types of tests were conducted namely (i) constant avalanche duration with different peak avalanche currents and (ii) constant peak avalanche current with different avalanche durations. SiC MOSFETs are shown to be the most rugged technology followed by the silicon IGBT and the silicon MOSFET. The material properties of SiC suppress the triggering of the parasitic BJT that causes thermal runaway during avalanche.
| Item Type: | Conference Item (Lecture) | ||||
|---|---|---|---|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | ||||
| Divisions: | Faculty of Science > Engineering | ||||
| Journal or Publication Title: | 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) | ||||
| Publisher: | IEE | ||||
| Official Date: | 2015 | ||||
| Dates: |
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| Page Range: | pp. 1833-1839 | ||||
| DOI: | 10.1109/ICPE.2015.7168028 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Lecture | ||||
| Title of Event: | Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on | ||||
| Type of Event: | Conference | ||||
| Location of Event: | Seoul, South Korea | ||||
| Date(s) of Event: | 1-5 Jun 2015 |
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