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Investigating the reliability of SiC MOSFET body diodes using Fourier series modelling
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Bonyadi, Roozbeh, Alatise, Olayiwola M., Jahdi, Saeed, Hu, Ji, Evans, L. and Mawby, P. A. (Philip A.) (2014) Investigating the reliability of SiC MOSFET body diodes using Fourier series modelling. In: Energy Conversion Congress and Exposition (ECCE), 2014 IEEE, Pittsburgh, PA, 14-18 Sept. 2014. Published in: 2014 IEEE Energy Conversion Congress and Exposition (ECCE) pp. 443-448. ISBN 9781479957767. doi:10.1109/ECCE.2014.6953427 ISSN 2329-3721.
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Official URL: http://dx.doi.org/10.1109/ECCE.2014.6953427
Abstract
Using the Fourier series solution to the ambipolar diffusion equation, the robustness of the body diodes of SiC MOSFETs during reverse recovery has been studied. Parasitic bipolar latch-up during the reverse recovery of the body diode is a possible if there is sufficient base current and voltage drop across the body resistance to forward bias the parasitic BJT. SiC MOSFETs have very low carrier lifetime and thin epitaxial drift layers, which means that the dV/dt during the recovery of the body diode can be quite high. This dV/dt coupled with the parasitic drain-to-body capacitance can cause a body current. The paper introduces a new way of assessing the reliability of SiC MOSFETs during the reverse recovery of the body diode. The impact of switching rates, parasitic inductances and carrier lifetime on the activation of the parasitic BJT has been studied.
Item Type: | Conference Item (Lecture) | |||||||||
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | |||||||||
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | |||||||||
Library of Congress Subject Headings (LCSH): | Metal oxide semiconductor field-effect transistors, Field-effect transistors, Heat equation, Silicon diodes, Power electronics, Fourier series -- Computer programs | |||||||||
Journal or Publication Title: | 2014 IEEE Energy Conversion Congress and Exposition (ECCE) | |||||||||
Publisher: | IEEE | |||||||||
ISBN: | 9781479957767 | |||||||||
ISSN: | 2329-3721 | |||||||||
Official Date: | 13 November 2014 | |||||||||
Dates: |
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Page Range: | pp. 443-448 | |||||||||
DOI: | 10.1109/ECCE.2014.6953427 | |||||||||
Status: | Peer Reviewed | |||||||||
Publication Status: | Published | |||||||||
Reuse Statement (publisher, data, author rights): | © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |||||||||
Access rights to Published version: | Restricted or Subscription Access | |||||||||
Date of first compliant deposit: | 13 January 2022 | |||||||||
Date of first compliant Open Access: | 13 January 2022 | |||||||||
RIOXX Funder/Project Grant: |
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Conference Paper Type: | Lecture | |||||||||
Title of Event: | Energy Conversion Congress and Exposition (ECCE), 2014 IEEE | |||||||||
Type of Event: | Conference | |||||||||
Location of Event: | Pittsburgh, PA | |||||||||
Date(s) of Event: | 14-18 Sept. 2014 |
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