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A controlled-force stylus displacement probe

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Chetwynd, D. G., Liu, Xianping and Smith, S. T. (1996) A controlled-force stylus displacement probe. Precision Engineering, 19 (2-3). pp. 105-111. doi:10.1016/S0141-6359(96)00008-6 ISSN 0141-6359.

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Official URL: http://dx.doi.org/10.1016/S0141-6359(96)00008-6

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Abstract

A novel design of displacement profiler with a controllable stylus force is presented. It provides highly controlled conditions for contact measurement of, for example, small step heights or surface roughness. Incorporating an electromagnetic force actuator and force feedback control, the profiler provides electronically selectable contact force in the range of 0.01–10 mN and gives a constant static and dynamic loading. In a typical configuration, it has a range of a few micrometers with a discrimination to better than 1 nm at a bandwidth higher than that of a conventional stylus instrument.

Item Type: Journal Article
Subjects: T Technology > T Technology (General)
T Technology > TJ Mechanical engineering and machinery
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Journal or Publication Title: Precision Engineering
Publisher: Elsevier Science Inc.
ISSN: 0141-6359
Official Date: October 1996
Dates:
DateEvent
October 1996Published
November 1996Available
Volume: 19
Number: 2-3
Page Range: pp. 105-111
DOI: 10.1016/S0141-6359(96)00008-6
Status: Peer Reviewed
Publication Status: Published

Data sourced from Thomson Reuters' Web of Knowledge

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