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Study on the lifetime characteristics of power modules under power cycling conditions
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Lai, Wei, Mawby, P. A. (Philip A.), Qin, Han, Alatise, Olayiwola M., Xu, Shengyou, Chen, Minyou and Ran, Li (2016) Study on the lifetime characteristics of power modules under power cycling conditions. IET Power Electronics, 9 (5). pp. 1045-1052. doi:10.1049/iet-pel.2015.0225 ISSN 1755-4535.
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Official URL: http://dx.doi.org/10.1049/iet-pel.2015.0225
Abstract
This study presents a study on non-linear accumulative modelling for power module lifetime estimation in non-accelerated operation. The model focuses on solder fatigue based on monitoring the internal thermal resistance of the module. Initially, the relatively small junction temperature variation (ΔTj) cycles contribute little to the lifetime consumption, but with an initial damage the effect becomes noticeable. The original Coffin-Manson accumulation approach is extended for complex mission profiles. The proposed non-linear accumulation model has three aspects: a Coffin-Manson relationship is first established; the thermal resistance degradation is then used to quantify damage accumulation; the effects of the average junction temperature (Tjmean) and ΔTj on the rate of degradation are finally included through the parameters of the non-linear accumulation model which also depends on the effect of the present condition of the module. Experiments demonstrate the phenomena and verify the proposed model.
| Item Type: | Journal Article | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||||||
| Journal or Publication Title: | IET Power Electronics | ||||||||
| Publisher: | IET | ||||||||
| ISSN: | 1755-4535 | ||||||||
| Official Date: | 28 April 2016 | ||||||||
| Dates: |
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| Volume: | 9 | ||||||||
| Number: | 5 | ||||||||
| Page Range: | pp. 1045-1052 | ||||||||
| DOI: | 10.1049/iet-pel.2015.0225 | ||||||||
| Status: | Peer Reviewed | ||||||||
| Publication Status: | Published | ||||||||
| Access rights to Published version: | Restricted or Subscription Access |
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