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Simultaneous interfacial reactivity and topography mapping with scanning ion conductance microscopy

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Momotenko, Dmitry, McKelvey, Kim M. (Kim Martin), Kang, Minkyung, Meloni, Gabriel N. and Unwin, Patrick R. (2016) Simultaneous interfacial reactivity and topography mapping with scanning ion conductance microscopy. Analytical Chemistry, 88 (5). pp. 2838-2846. doi:10.1021/acs.analchem.5b04566

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Official URL: http://dx.doi.org/10.1021/acs.analchem.5b04566

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Abstract

Scanning ion conductance microscopy (SICM) is a powerful technique for imaging the topography of a wide range of materials and interfaces. In this report, we develop the use and scope of SICM, showing how it can be used for mapping spatial distributions of ionic fluxes due to (electro)chemical reactions occurring at interfaces. The basic idea is that there is a change of ion conductance inside a nanopipet probe when it approaches an active site, where the ionic composition is different to that in bulk solution, and this can be sensed via the current flow in the nanopipet with an applied bias. Careful tuning of the tip potential allows the current response to be sensitive to either topography or activity, if desired. Furthermore, the use of a distance modulation SICM scheme allows reasonably faithful probe positioning using the resulting ac response, irrespective of whether there is a reaction at the interface that changes the local ionic composition. Both strategies (distance modulation or tuned bias) allow simultaneous topography-activity mapping with a single channel probe. The application of SICM reaction imaging is demonstrated on several examples, including voltammetric mapping of electrocatalytic reactions on electrodes and high-speed electrochemical imaging at rates approaching 4 s per image frame. These two distinct approaches provide movies of electrochemical current as a function of potential with hundreds of frames (images) of surface reactivity, to reveal a wealth of spatially resolved information on potential- (and time) dependent electrochemical phenomena. The experimental studies are supported by detailed finite element method modeling that places the technique on a quantitative footing.

Item Type: Journal Article
Subjects: T Technology > TP Chemical technology
Divisions: Faculty of Science, Engineering and Medicine > Science > Chemistry
Library of Congress Subject Headings (LCSH): Electrochemical apparatus -- Industrial applications -- Research
Journal or Publication Title: Analytical Chemistry
Publisher: American Chemical Society
ISSN: 0003-2700
Official Date: 22 January 2016
Dates:
DateEvent
22 January 2016Published
22 January 2016Accepted
1 December 2015Submitted
Volume: 88
Number: 5
Page Range: pp. 2838-2846
DOI: 10.1021/acs.analchem.5b04566
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Funder: European Research Council (ERC), Marie Curie Intra-European Fellowship (IEF)
Grant number: ERC - 2009 AdG, 247143 - QUANTIF, 626158 FUNICIS (D.M.). (IEF)

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