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Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon
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Grant, Nicholas E., Markevich, Vladimir P., Mullins, Jack, Peaker, Anthony R., Rougieux, Fiacre and Macdonald, Daniel (2016) Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon. physica status solidi (RRL) - Rapid Research Letters . doi:10.1002/pssr.201600080 ISSN 1862-6254.
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Official URL: http://dx.doi.org/10.1002/pssr.201600080
Abstract
A growing literature argues that mental well-being follows an approximate U-shape through life. Yet in the eyes of some scholars this evidence remains controversial. The reason is that it relies on people’s answers to ‘happiness’ surveys. The present paper explores a different approach. It examines modern data on the use of antidepressant pills (as an implicit signal of mental distress) in 27 European nations. The regression-adjusted probability of using antidepressants reaches a peak in people’s late 40s. This pattern – one that does not rely on well-being survey answers – is thus consistent with the claim that human beings experience a midlife low.
Item Type: | Journal Article | ||||||||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||||||||
Journal or Publication Title: | physica status solidi (RRL) - Rapid Research Letters | ||||||||||
Publisher: | Wiley - V C H Verlag GmbH & Co. KGaA | ||||||||||
ISSN: | 1862-6254 | ||||||||||
Official Date: | July 2016 | ||||||||||
Dates: |
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DOI: | 10.1002/pssr.201600080 | ||||||||||
Status: | Peer Reviewed | ||||||||||
Publication Status: | Published | ||||||||||
Access rights to Published version: | Restricted or Subscription Access |
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