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Enhanced resolution electric force microscopy with single-wall carbon nanotube tips
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UNSPECIFIED. (2004) Enhanced resolution electric force microscopy with single-wall carbon nanotube tips. JOURNAL OF APPLIED PHYSICS, 96 (6). pp. 3565-3567. ISSN 0021-8979
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Official URL: http://dx.doi.org/10.1063/1.1781759
Abstract
Electric force microscopy (EFM) is widely used for studying small-scale electrical structures. Its applicability is limited by its spatial resolution and the difficulty of deconvoluting tip effects from the image. We demonstrate that the use of single-wall carbon nanotube (SWNT) tips increases EFM spatial resolution, allowing similar features to be distinguished with separations as small as 15 nm. In addition, we show that the EFM response of the SWNT tips is consistent with a uniform-line-charge model. (C) 2004 American Institute of Physics.
| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QC Physics |
| Journal or Publication Title: | JOURNAL OF APPLIED PHYSICS |
| Publisher: | AMER INST PHYSICS |
| ISSN: | 0021-8979 |
| Date: | 15 September 2004 |
| Volume: | 96 |
| Number: | 6 |
| Number of Pages: | 3 |
| Page Range: | pp. 3565-3567 |
| Identification Number: | 10.1063/1.1781759 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/8056 |
Data sourced from Thomson Reuters' Web of Knowledge
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