UNSPECIFIED (2004) Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles. In: 16th International Conference on Ion Beam Analysis, Albuquerque, NM, JUN 29-JUL 04, 2003. Published in: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 219-20 pp. 278-283.

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Abstract

Experiments are reported on the non-additivity of a multiply charged ion emission with various atomic and molecular projectiles. A distinction has been found in the non-additivity of the Si2+ emission from Si. It manifests itself as a change of the non-additivity factor K-2.1 from K-2.1 < 1 (sub-linear effect) to K-2.1 > 1 (non-additive enhancement effect) in going from Au-2(-) to Cu-2(-) projectiles. It was shown that the sub-linear behaviour of K-2.1 is caused by the correlated move of projectiles gold atoms in a target matter (the clearing-the-way effect) and the origin of the nonadditive enhancement is not determined by non-linear cascade sputtering. On the basis of the results obtained a new effect in an ion-induced atomic-like Auger electron emission has been predicted. (C) 2004 Elsevier B.V. All rights reserved.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	Q Science > QC Physics
Journal or Publication Title:	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Publisher:	ELSEVIER SCIENCE BV
ISSN:	0168-583X
Date:	June 2004
Volume:	219-20
Number of Pages:	6
Page Range:	pp. 278-283
Identification Number:	10.1016/j.nimb.2004.01.068
Publication Status:	Published
Title of Event:	16th International Conference on Ion Beam Analysis
Location of Event:	Albuquerque, NM
Date(s) of Event:	JUN 29-JUL 04, 2003
URI:	http://wrap.warwick.ac.uk/id/eprint/8344

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