Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles
UNSPECIFIED (2004) Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles. In: 16th International Conference on Ion Beam Analysis, Albuquerque, NM, JUN 29-JUL 04, 2003. Published in: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 219-20 pp. 278-283.Full text not available from this repository.
Official URL: http://dx.doi.org/10.1016/j.nimb.2004.01.068
Experiments are reported on the non-additivity of a multiply charged ion emission with various atomic and molecular projectiles. A distinction has been found in the non-additivity of the Si2+ emission from Si. It manifests itself as a change of the non-additivity factor K-2.1 from K-2.1 < 1 (sub-linear effect) to K-2.1 > 1 (non-additive enhancement effect) in going from Au-2(-) to Cu-2(-) projectiles. It was shown that the sub-linear behaviour of K-2.1 is caused by the correlated move of projectiles gold atoms in a target matter (the clearing-the-way effect) and the origin of the nonadditive enhancement is not determined by non-linear cascade sputtering. On the basis of the results obtained a new effect in an ion-induced atomic-like Auger electron emission has been predicted. (C) 2004 Elsevier B.V. All rights reserved.
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS|
|Publisher:||ELSEVIER SCIENCE BV|
|Official Date:||June 2004|
|Number of Pages:||6|
|Page Range:||pp. 278-283|
|Title of Event:||16th International Conference on Ion Beam Analysis|
|Location of Event:||Albuquerque, NM|
|Date(s) of Event:||JUN 29-JUL 04, 2003|
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