Burrows, Christopher W., Hase, Thomas P. A., Ashwin, M. J., Mousley, Philip and Bell, Gavin R. (2017) Depth sensitive X-ray diffraction as a probe of buried half-metallic inclusions. Physica Status Solidi. B: Basic Research, 254 (2). doi:10.1002/pssb.201600543

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Abstract

The ferromagnetic material MnSb can exist in two polymorphs in epitaxial thin-film form, namely niccolite n-MnSb and cubic c-MnSb. We investigate the behavior of these polymorphs using grazing incidence depth-dependent in-plane X-ray diffraction. The in-plane lattice parameter evolution of a nominal 3000 Å thin film reveals a small near-surface compression of math formula0.1% in the majority n-MnSb component. A similar effect is also observed for the cubic polymorph, suggesting that the local strain environment of these crystallites is dominated by the n-MnSb matrix.

Item Type:	Journal Article
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:	Faculty of Science > Physics
Library of Congress Subject Headings (LCSH):	Semiconductor films, Spintronics, X-rays -- Diffraction
Journal or Publication Title:	Physica Status Solidi. B: Basic Research
Publisher:	Wiley - V C H Verlag GmbH & Co.
ISSN:	0370-1972
Official Date:	February 2017
Dates:	Date Event February 2017 Published 25 October 2016 Available 5 October 2016 Accepted 14 August 2016 Submitted
Volume:	254
Number:	2
DOI:	10.1002/pssb.201600543
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Open Access
Funder:	Engineering and Physical Sciences Research Council (EPSRC)
Grant number:	EP/K032852/1, EP/K03278X/1

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