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Simultaneous dynamic electrical and structural measurements of functional materials
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Vecchini, C., Thompson, P., Stewart, M., Muniz-Piniella, A., McMitchell, S. R. C., Wooldridge, J., Lepadatu, S., Bouchenoire, L., Brown, S., Wermeille, D., Bikondoa, Oier, Lucas, C. A., Hase, Thomas P. A., Lesourd, M., Dontsov, D. and Cain, M. G. (2015) Simultaneous dynamic electrical and structural measurements of functional materials. Review of Scientific Instruments, 86 (10). 103901. ISSN 0034-6748.
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Official URL: https://doi.org/10.1063%2F1.4931992
Abstract
A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneously measuring the overall strain characteristics and electrical response to dynamically (ac) applied external stimuli.
| Item Type: | Journal Article | ||||
|---|---|---|---|---|---|
| Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
| Journal or Publication Title: | Review of Scientific Instruments | ||||
| Publisher: | American Institute of Physics | ||||
| ISSN: | 0034-6748 | ||||
| Official Date: | October 2015 | ||||
| Dates: |
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| Volume: | 86 | ||||
| Number: | 10 | ||||
| Article Number: | 103901 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access |
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