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Maximum entropy mobility spectrum analysis for magnetotransport characterization of semiconductor multilayer structures
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UNSPECIFIED (2001) Maximum entropy mobility spectrum analysis for magnetotransport characterization of semiconductor multilayer structures. In: 25th International Semiconductor Conference, OCT 08-12, 2002, SINAIA, ROMANIA.
Full text not available from this repository.Abstract
The maximum entropy mobility spectrum analysis (ME-MSA) method has been developed on the basis of a maximum entropy (ME) principle. It allows to calculate a smooth electrical conductivity versus mobility plot ("mobility spectrum") from the classical magnetoconductivity tensor in semiconductor multilayer structures. The advantages of the ME-MSA as compared to the MSA are demonstrated using a synthetic data set.
| Item Type: | Conference Item (UNSPECIFIED) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
| Journal or Publication Title: | CAS: 2002 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS |
| Publisher: | IEEE |
| ISBN: | 0-7803-7440-1 |
| Date: | 2001 |
| Number of Pages: | 4 |
| Page Range: | pp. 415-418 |
| Publication Status: | Published |
| Title of Event: | 25th International Semiconductor Conference |
| Location of Event: | SINAIA, ROMANIA |
| Date(s) of Event: | OCT 08-12, 2002 |
| URI: | http://wrap.warwick.ac.uk/id/eprint/8984 |
Data sourced from Thomson Reuters' Web of Knowledge
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