Kourra, Nadia, Warnett, Jason M., Attridge, Alex and Williams, M. A. (2017) Metrological investigation of radiation filtration in x-ray computed tomography. In: Instrumentation and Measurement Technology Conference (I2MTC), Torino, Italy, Italy, 22-25 May 2017. Published in: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), pp. 1-6. ISBN 9781509035960. doi:10.1109/I2MTC.2017.7969797

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Abstract

X-ray Computed Tomography (CT) is a nondestructive evaluation method that gains recognition in dimensional metrology applications. During a CT scan, 2D radiographs are collected that are then reconstructed to a 3D model which allows non-destructive evaluation of the specimen and assists with the characterisations of defects. This technology has the potential to provide information unobtainable by other non-destructive, non-contact techniques. There are numerous factors that can affect the CT measurement results with varying measurement uncertainty such as shifts and changes of x-ray focal spot, geometrical alignment issues and environmental issues. This study investigates the effect of physical pre and post filtration on the resultant dimensional measurements. Here, a calibrated specimen is used based on one of the considered designs for the proposed ISO 10360-11 CT for dimensional measurements. The resultant in local variations of grey values in the volume is measured for different thicknesses of copper filtering placed before and after the scanned specimen, and the resultant threshold dependent and independent measurements are evaluated. The results provide information that assists the selection of filtration in order to reduce measurement error and improve dimensional measurements, and also demonstrate that post filtration should be considered when scanning specimens that generate large amounts of scatter.

Item Type:	Conference Item (Paper)
Subjects:	T Technology > T Technology (General) T Technology > TJ Mechanical engineering and machinery T Technology > TS Manufactures
Divisions:	Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group)
Library of Congress Subject Headings (LCSH):	Tomography, Emission, Metrology, X-rays, Imaging systems in medicine
Journal or Publication Title:	2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
Publisher:	IEEE Computer Society
ISBN:	9781509035960
Book Title:	2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Official Date:	7 July 2017
Dates:	Date Event 7 July 2017 Published 23 May 2017 Available 10 January 2017 Accepted 10 November 2016 Submitted
Page Range:	pp. 1-6
DOI:	10.1109/I2MTC.2017.7969797
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
Date of first compliant deposit:	21 July 2017
Date of first compliant Open Access:	2 August 2017
Funder:	BAE SYSTEMS (Firm)‏, Engineering and Physical Sciences Research Council (EPSRC)
Conference Paper Type:	Paper
Title of Event:	Instrumentation and Measurement Technology Conference (I2MTC)
Type of Event:	Conference
Location of Event:	Torino, Italy, Italy
Date(s) of Event:	22-25 May 2017

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