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Data for Low-temperature saw damage gettering to improve minority carrier lifetime in multicrystalline silicon

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Al-Amin, Mohammad, Grant, Nicholas E. and Murphy, John D. (2017) Data for Low-temperature saw damage gettering to improve minority carrier lifetime in multicrystalline silicon. [Dataset]

[img] Plain Text (Readme file)
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[img] Microsoft Excel (Data underpinning Figures 1 and 3)
2017-08-29 Dataset for WRAP.xlsx - Unspecified Version
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Official URL: https://wrap.warwick.ac.uk/91528/

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Abstract

The minority carrier lifetime in multicrystalline silicon − a material used in the majority of today's manufactured solar cells − is limited by defects within the material, including metallic impurities which are relatively mobile at low temperatures (≤700 °C). Addition of an optimised thermal process which can facilitate impurity diffusion to the saw damage at the wafer surfaces can result in permanent removal of the impurities when the saw damage is etched away. We demonstrate that this saw damage gettering is effective at 500 to 700 °C and, when combined with subsequent low-temperature processing, lifetimes are improved by a factor of more than four relative to the as-grown state. The simple method has the potential to be a low thermal budget process for the improvement of low-lifetime “red zone” wafers.

Item Type: Dataset
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Type of Data: Experimental data
Library of Congress Subject Headings (LCSH): Silicon solar cells, Getters, Silicon crystals, Aluminum alloys
Publisher: University of Warwick, School of Engineering
Official Date: 4 September 2017
Dates:
DateEvent
4 September 2017Published
29 August 2017Available
Status: Not Peer Reviewed
Access rights to Published version: Open Access
Description:

The dataset (a single file in XLSX format) contains the data behind all the graphs presented in the paper. Each worksheet within the spreadsheet relates to a single figure in the paper. Captions to the figures are given in the paper. Abbreviations, variables and methods used are defined in the paper.

RIOXX Funder/Project Grant:
Project/Grant IDRIOXX Funder NameFunder ID
EP/J01768X/2 [EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/M024911/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/P511079/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
UNSPECIFIEDRoyal Societyhttp://dx.doi.org/10.13039/501100000288
UNSPECIFIEDRoyal Academy of Engineeringhttp://dx.doi.org/10.13039/501100000287
Related URLs:
  • Related item in WRAP
Contributors:
ContributionNameContributor ID
DepositorMurphy, John D.55925

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