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Low-temperature saw damage gettering to improve minority carrier lifetime in multicrystalline silicon

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Al-Amin, Mohammad, Grant, Nicholas E. and Murphy, John D. (2017) Low-temperature saw damage gettering to improve minority carrier lifetime in multicrystalline silicon. Physica Status Solidi Rapid Research Letters, 11 (10). 1700268.

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Official URL: https://doi.org/10.1002/pssr.201700268

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Abstract

The minority carrier lifetime in multicrystalline silicon − a material used in the majority of today's manufactured solar cells − is limited by defects within the material, including metallic impurities which are relatively mobile at low temperatures (≤700 °C). Addition of an optimised thermal process which can facilitate impurity diffusion to the saw damage at the wafer surfaces can result in permanent removal of the impurities when the saw damage is etched away. We demonstrate that this saw damage gettering is effective at 500 to 700 °C and, when combined with subsequent low-temperature processing, lifetimes are improved by a factor of more than four relative to the as-grown state. The simple method has the potential to be a low thermal budget process for the improvement of low-lifetime “red zone” wafers.

Item Type: Journal Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Library of Congress Subject Headings (LCSH): Silicon solar cells, Getters, Silicon crystals, Aluminum alloys
Journal or Publication Title: Physica Status Solidi Rapid Research Letters
Publisher: Wiley
ISSN: 1862-6270
Official Date: October 2017
Dates:
DateEvent
October 2017Published
4 September 2017Available
23 August 2017Accepted
Volume: 11
Number: 10
Article Number: 1700268
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Open Access
RIOXX Funder/Project Grant:
Project/Grant IDRIOXX Funder NameFunder ID
EP/J01768X/2[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/M024911/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/P511079/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
RG100076Royal Societyhttp://dx.doi.org/10.13039/501100000288
UNSPECIFIEDRoyal Academy of Engineeringhttp://dx.doi.org/10.13039/501100000287
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