Yim, S. and Jones, T. S. (Tim S.). (2009) Growth dynamics of C60 thin films: effect of molecular structure. Applied Physics Letters, Vol.94 (No.2). 021911. ISSN 0003-6951

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Abstract

The surface morphology and growth behavior of fullerene thin films have been studied by atomic force microscopy and height difference correlation function analysis. In contrast to the large growth exponents (beta) previously reported for other organic semiconductor thin-film materials, a relatively small beta value of 0.39±0.10 was determined. Simulations of (1+1)-dimensional surface lateral diffusion models indicate that the evolution of deep grain boundaries leads to a rapid increase in beta. We suggest that the commonly observed large beta values for organic thin films are due to their intrinsically anisotropic molecular structures and hence different stacking directions between crystallite domains.

Item Type:	Journal Article
Subjects:	Q Science > QD Chemistry
Divisions:	Faculty of Science > Chemistry
Library of Congress Subject Headings (LCSH):	Atomic force microscopy, Semiconductor films, Fullerenes, Morphology, Semiconductors -- Diffusion
Journal or Publication Title:	Applied Physics Letters
Publisher:	American Institute of Physics
ISSN:	0003-6951
Date:	16 January 2009
Volume:	Vol.94
Number:	No.2
Page Range:	021911
Identification Number:	10.1063/1.3072805
Status:	Peer Reviewed
Access rights to Published version:	Open Access
Funder:	Han'guk Haksul Chinhŭng Chaedan [Korea Research Foundation] (HHCC), Kungmin Taehakkyo (Korea) (KT)
Grant number:	KRF-2008-331- C00138 (HHCC)
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URI:	http://wrap.warwick.ac.uk/id/eprint/945

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