The Library
Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry
Tools
Jia, Dagong, Yu, Changsong, Xu, Tianhua, Jin, Chao, Zhang, Hongxia, Jing, Wencai and Zhang, Yimo (2008) Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry. In: 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, Beijing, China, 16-19 Nov 2008. Published in: Proceedings of SPIE - International Society for Optical Engineering, 7160 p. 716014. doi:10.1117/12.806992 ISSN 0277-786X.
|
PDF
WRAP-vibration-analysis-electronic-stroboscopic-pattern-Xu-2008.pdf - Accepted Version - Requires a PDF viewer. Download (1352Kb) | Preview |
Official URL: http://dx.doi.org/10.1117/12.806992
Abstract
In this paper, an electronic speckle-shearing pattern interferometer with pulsed laser and pulse frequency controller is fabricated. The principle of measuring the vibration in the object using electronic stroboscopic speckle--shearing pattern interferometer is analyzed. Using a metal plate, the edge of which is clamped, as an experimental specimen, the shear interferogram are obtained under two experimental frequencies, 100 Hz and 200 Hz. At the same time, the vibration of this metal plate under the same experimental conditions is measured using the time-average method in order to test the performance of this electronic stroboscopic speckle-shearing pattern interferometer. The result indicated that the fringe of shear interferogram become dense with the experimental frequency increasing. Compared the fringe pattern obtained by the stroboscopic method with the fringe obtained by the time-average method, the shearing interferogram of stroboscopic method is clearer than the time-average method. In addition, both the time-average method and stroboscopic method are suited for qualitative analysis for the vibration of the object. More over, the stroboscopic method is well adapted to quantitative vibration analysis.
Item Type: | Conference Item (Paper) | |||||||||
---|---|---|---|---|---|---|---|---|---|---|
Subjects: | Q Science > QC Physics | |||||||||
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | |||||||||
Library of Congress Subject Headings (LCSH): | Speckle, Interferometry | |||||||||
Journal or Publication Title: | Proceedings of SPIE - International Society for Optical Engineering | |||||||||
Publisher: | S P I E - International Society for Optical Engineering | |||||||||
ISSN: | 0277-786X | |||||||||
Book Title: | 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications | |||||||||
Official Date: | 3 February 2008 | |||||||||
Dates: |
|
|||||||||
Volume: | 7160 | |||||||||
Page Range: | p. 716014 | |||||||||
DOI: | 10.1117/12.806992 | |||||||||
Status: | Peer Reviewed | |||||||||
Publication Status: | Published | |||||||||
Access rights to Published version: | Restricted or Subscription Access | |||||||||
Date of first compliant deposit: | 15 November 2017 | |||||||||
Date of first compliant Open Access: | 15 November 2017 | |||||||||
RIOXX Funder/Project Grant: |
|
|||||||||
Conference Paper Type: | Paper | |||||||||
Title of Event: | 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications | |||||||||
Type of Event: | Conference | |||||||||
Location of Event: | Beijing, China | |||||||||
Date(s) of Event: | 16-19 Nov 2008 |
Request changes or add full text files to a record
Repository staff actions (login required)
View Item |
Downloads
Downloads per month over past year