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Electronic speckle-shearing pattern interferometry for vibration analysis
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Jing, Chao, Jing, Wencai, Xu, Tianhua, Liu, Na, Zhou, Ge and Zhang, Yimo (2006) Electronic speckle-shearing pattern interferometry for vibration analysis. Nanotechnology and Precision Engineering [Nami Jishu yu Jingmi Gongcheng], 4 (1). pp. 58-62. ISSN 1672-6030.
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Official URL: http://en.cnki.com.cn/Article_en/CJFDTOTAL-NMJM200...
Abstract
Electronic speckle-shearing patten interferometry (ESSPI) has been applied for non destructive tes-ting(NDT) , strain analysis,vibration analysis and flow field analysis as a kind of high - precision full - field measurement. ESSPI is applied for vibration analysis in this paper. The theory of time - average method is analyzed in this paper,and the optical structure of ESSPI is designed for achieving vibration analysis of large area. The rectangle area of 669 mm ×502 mm is once measured by ESSPI. Random height function of surfaces of Gauss correlation and images of speckle - shearing Patten stripes engendered by vibration are simulated by computer. It is proved that ESSPI can be applied for vibration analysis.
Item Type: | Journal Article | ||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Journal or Publication Title: | Nanotechnology and Precision Engineering [Nami Jishu yu Jingmi Gongcheng] | ||||
Publisher: | Tianjin Daxue | ||||
ISSN: | 1672-6030 | ||||
Official Date: | 2006 | ||||
Dates: |
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Volume: | 4 | ||||
Number: | 1 | ||||
Page Range: | pp. 58-62 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access |
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