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Composition profiles of InAs–GaAs quantum dots determined by medium-energy ion scattering

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Quinn, P. D., Wilson, Neil Richard, 1977-, Hatfield, S. A., McConville, C. F. (Chris F.), Bell, Gavin R., Noakes, T. C. Q., Bailey, P., Al-Harthi, S. and Grad, F.. (2005) Composition profiles of InAs–GaAs quantum dots determined by medium-energy ion scattering. Applied Physics Letters, Vol.87 (No.15). p. 153110. ISSN 0003-6951

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Official URL: http://dx.doi.org/10.1063/1.2099533

Abstract

The composition profile along the [001] growth direction of low-growth-rate InAs–GaAs quantum dots (QDs) has been determined using medium-energy ion scattering (MEIS). A linear profile of In concentration from 100% In at the top of the QDs to 20% at their base provides the best fit to MEIS energy spectra.

Item Type: Journal Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Q Science > QC Physics
Divisions: Faculty of Science > Physics
Library of Congress Subject Headings (LCSH): Indium compounds, Gallium arsenide semiconductors, Quantum dots, Epitaxy
Journal or Publication Title: Applied Physics Letters
Publisher: American Institute of Physics
ISSN: 0003-6951
Date: 5 October 2005
Volume: Vol.87
Number: No.15
Page Range: p. 153110
Identification Number: 10.1063/1.2099533
Status: Peer Reviewed
Access rights to Published version: Open Access
Funder: Royal Society (Great Britain), Engineering and Physical Sciences Research Council (EPSRC)
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URI: http://wrap.warwick.ac.uk/id/eprint/982

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