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An analytical model for the detection of levitated nanoparticles in optomechanics

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Rahman, A. T. M. Anishur, Frangeskou, Angelo, Barker, P. F. and Morley, Gavin (2018) An analytical model for the detection of levitated nanoparticles in optomechanics. Review of Scientific Instruments, 89 (2). 023109. doi:10.1063/1.5008396

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Official URL: http://dx.doi.org/10.1063/1.5008396

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Abstract

Interferometric position detection of levitated particles is crucial for the centre-of-mass (CM) motion cooling and manipulation of levitated particles. In combination with balanced detection and feedback cooling, this system has provided picometer scale position sensitivity, zeptonewton force detection, and sub-millikelvin CM temperatures. In this article, we develop an analytical model of this detection system and compare its performance with experimental results allowing us to explain the presence of spurious frequencies in the spectra.

Item Type: Journal Article
Subjects: T Technology > TS Manufactures
Divisions: Faculty of Science, Engineering and Medicine > Science > Physics
Library of Congress Subject Headings (LCSH): Optomechanics, Interferometry, Nanoparticles
Journal or Publication Title: Review of Scientific Instruments
Publisher: American Institute of Physics
ISSN: 0034-6748
Official Date: 9 February 2018
Dates:
DateEvent
9 February 2018Available
15 January 2018Accepted
Volume: 89
Number: 2
Article Number: 023109
DOI: 10.1063/1.5008396
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
RIOXX Funder/Project Grant:
Project/Grant IDRIOXX Funder NameFunder ID
EP/M013243/1 Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/J014664/1Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
UNSPECIFIEDRoyal Societyhttp://dx.doi.org/10.13039/501100000288
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