Aspects of layer-by-layer composition analysis using MEIS
UNSPECIFIED (2003) Aspects of layer-by-layer composition analysis using MEIS. In: 2nd International Workshop on Ion Beam Techniques for the Analysis of Composition and Structure with Single Atomic Resolution, KYONGJU, SOUTH KOREA, SEP 24-27, 2002. Published in: CURRENT APPLIED PHYSICS, 3 (1). pp. 89-92.Full text not available from this repository.
Official URL: http://dx.doi.org/10.1016/S1567-1739(02)00242-0
The shadowing/blocking characteristics of medium energy ion scattering allow a precise deduction of the layer-by-layer composition of alloy crystal surfaces. The technique relies on an accurate alignment of the ion beam with known crystallographic directions to restrict the incoming beam to illuminate just the topmost one, two or three or more layers. Further layer specificity is bestowed by utilising outgoing geometries that block ions from all but the top one, two, etc., layers respectively. The size of shadow cones associated with medium energy hydrogen and helium ions is ideal for this application. A plot of the averaged experimental yields against simulated yields for several different systems implies an inconsistency in the technique. Possible explanations for this are discussed and a clarifying experiment is suggested. (C) 2003 Elsevier Science B.V. All rights reserved.
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)
Q Science > QC Physics
|Journal or Publication Title:||CURRENT APPLIED PHYSICS|
|Publisher:||ELSEVIER SCIENCE BV|
|Number of Pages:||4|
|Page Range:||pp. 89-92|
|Title of Event:||2nd International Workshop on Ion Beam Techniques for the Analysis of Composition and Structure with Single Atomic Resolution|
|Location of Event:||KYONGJU, SOUTH KOREA|
|Date(s) of Event:||SEP 24-27, 2002|
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