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Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers
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Norris, D. J., Myronov, Maksym, Leadley, D. R. and Walther, T. (2017) Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers. Journal of Microscopy, 268 (3). pp. 288-297. doi:10.1111/jmi.12654 ISSN 0022-2720.
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Official URL: http://dx.doi.org/10.1111/jmi.12654
Item Type: | Journal Article | ||||||
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Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||||
Journal or Publication Title: | Journal of Microscopy | ||||||
Publisher: | Wiley-Blackwell Publishing, Inc | ||||||
ISSN: | 0022-2720 | ||||||
Official Date: | 3 October 2017 | ||||||
Dates: |
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Volume: | 268 | ||||||
Number: | 3 | ||||||
Page Range: | pp. 288-297 | ||||||
DOI: | 10.1111/jmi.12654 | ||||||
Status: | Peer Reviewed | ||||||
Publication Status: | Published | ||||||
Access rights to Published version: | Open Access (Creative Commons) |
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