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The XMaS beamline at ESRF: instrumental developments and high resolution diffraction studies
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UNSPECIFIED (2001) The XMaS beamline at ESRF: instrumental developments and high resolution diffraction studies. JOURNAL OF SYNCHROTRON RADIATION, 8 (Part 6). pp. 1172-1181. ISSN 0909-0495.
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Abstract
The beamline, which is situated on a bending magnet at ESRF, comprises a unique combination of instrumentation for high-resolution and magnetic single-crystal diffraction. White-beam operation is possible, as well as focused and unfocused monochromatic modes. In addition to an eleven-axis Huber diffractometer, which facilitates simple operation in both vertical and horizontal scattering geometries, there is an in-vacuum polarisation analyser and slit system, mirrors for harmonic rejection, sub 4.2 K and 1 Tesla magnetic field sample environment, plus a diamond phase plate for polarisation conditioning. The instrumentation developed specifically for this beamline is described, and its use illustrated by recent scientific results.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | JOURNAL OF SYNCHROTRON RADIATION | ||||
Publisher: | MUNKSGAARD INT PUBL LTD | ||||
ISSN: | 0909-0495 | ||||
Official Date: | November 2001 | ||||
Dates: |
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Volume: | 8 | ||||
Number: | Part 6 | ||||
Number of Pages: | 10 | ||||
Page Range: | pp. 1172-1181 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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