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Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode
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UNSPECIFIED (2001) Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode. ELECTROCHEMICAL AND SOLID STATE LETTERS, 4 (9). E33-E36. doi:10.1149/1.1388195 ISSN 1099-0062.
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Official URL: http://dx.doi.org/10.1149/1.1388195
Abstract
Pt microwire atomic force microscope (AFM) probes have been employed to characterize the electrical and topographical properties of a Ti/TiO2/Pt anode. The anode consisted of supported Pt metal microparticles in a porous Ti/TiO2 film. Pt microwire probes were found to be more reliable than Pt-coated Si3N4 tips for conductivity mapping in contact mode. Preliminary results revealed a marked spatial heterogeneity in the current-voltage characteristics of the Pt microdeposits, attributed to the nature of the subsurface Pt contact to the underlying Ti/TiO2 substrate. Prospects for using conducting-AFM more widely to characterize the local electrical properties of complex electrode materials are highlighted. (C) 2001 The Electrochemical Society.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QD Chemistry T Technology > TA Engineering (General). Civil engineering (General) |
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Journal or Publication Title: | ELECTROCHEMICAL AND SOLID STATE LETTERS | ||||
Publisher: | ELECTROCHEMICAL SOC INC | ||||
ISSN: | 1099-0062 | ||||
Official Date: | September 2001 | ||||
Dates: |
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Volume: | 4 | ||||
Number: | 9 | ||||
Number of Pages: | 4 | ||||
Page Range: | E33-E36 | ||||
DOI: | 10.1149/1.1388195 | ||||
Publication Status: | Published |
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