The Library
In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate
Tools
UNSPECIFIED (2000) In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate. JOURNAL OF PHYSICS-CONDENSED MATTER, 12 (15). pp. 3521-3529. ISSN 0953-8984.
Research output not available from this repository.
Request-a-Copy directly from author or use local Library Get it For Me service.
Abstract
In situ high temperature x-ray diffraction measurements have been performed on a (TiO2)(0.18) (SiO2)(0.82) xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 degrees C to 310 degrees C An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.
Item Type: | Journal Article | ||||
---|---|---|---|---|---|
Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | JOURNAL OF PHYSICS-CONDENSED MATTER | ||||
Publisher: | IOP PUBLISHING LTD | ||||
ISSN: | 0953-8984 | ||||
Official Date: | 17 April 2000 | ||||
Dates: |
|
||||
Volume: | 12 | ||||
Number: | 15 | ||||
Number of Pages: | 9 | ||||
Page Range: | pp. 3521-3529 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
Request changes or add full text files to a record
Repository staff actions (login required)
View Item |