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Photoelectron diffraction study of ultrathin Fe films on Cu{111}
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UNSPECIFIED (1999) Photoelectron diffraction study of ultrathin Fe films on Cu{111}. PHYSICAL REVIEW B, 59 (3). pp. 2313-2319. ISSN 0163-1829.
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Abstract
Using photoelectron diffraction in the scanned-energy mode we show that at 300 K iron grows pseudomorphically on Cu{111} up to a thickness of about two equivalent monolayers. The Fe-Cu layer separation is 1.99 Angstrom. Above this thickness the film becomes bcc with {110} orientation and is aligned such that the [111] rows are parallel to the [110] rows of the fcc{111} surface (Kurdjumov-Sachs orientation). The Fe-Fe first-layer separation is 1.95 Angstrom. [S0163-1829(99)01903-7].
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | PHYSICAL REVIEW B | ||||
Publisher: | AMERICAN PHYSICAL SOC | ||||
ISSN: | 0163-1829 | ||||
Official Date: | 15 January 1999 | ||||
Dates: |
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Volume: | 59 | ||||
Number: | 3 | ||||
Number of Pages: | 7 | ||||
Page Range: | pp. 2313-2319 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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